January 31, 2021 | 12:30 pm

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The Gigafactory model requires reliable materials characterization to achieve the promised efficiencies of vertical integration. Unifying the synthesis of battery materials, processing such as dispersion into inks, and production of cells is the first step to high-volume production and reducing vulnerability to supply chain problems. These steps benefit from automated high-throughput materials analysis that can be used for process control. This webinar will discuss in-line and at-line instrumentation combined with automated analyses from microstructural (particle size with laser diffraction) to chemical (stoichiometry with XRF) to atomic level (Li/Ni site mixing with XRD).

This webinar will focus on the following key topics:

• In-line and at-line materials characterization and automated analyses
• Asset management to maximum uptime
• At-line X-ray diffraction analysis of lattice parameters and Li/Ni site mixing
• At-line X-ray fluorescence analysis to quantify Ni-Mn-Co stoichiometry
• In-line particle size analysis to control milling during dispersion

Presenter
Scott A Speakman, PhD – XRD Principal Scientist at Malvern Panalytical

Scott Speakman Ph. D joined Malvern Panalytical as Principal Scientist in 2014. Prior to joining the company, Scott managed the X-ray Shared Experimental Facility at MIT for 8 years. He earned his Ph. D from Alfred University, where he worked with Prof. Scott Misture on in situ X-ray diffraction analysis of ionic conductors for solid oxide fuel cells. He also was a post-doctoral research associate with the Diffraction and Thermophysical Properties group at Oak Ridge National Lab. Scott is a Fellow of the International Center for Diffraction Data and was awarded a 2013 Infinite Mile Award for extraordinary service to MIT.

Malvern Panalytical is a proud sponsor of this event.

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