February 06, 2021 | 6:00 pm

$0.00

To optimize the chemical composition of the final cathode materials, it is first essential to control the chemical composition of the precursor and raw materials. X-ray fluorescence (XRF) analysis, which can characterize chemical composition and impurities from just a few ppm all the way up to 100%, is the best technique for controlling this parameter.

Specifically, XRF provides a simpler and more accurate way of measuring elemental composition than inductively coupled plasma (ICP) mass spectrometry, as it does not require any sample dilution or acid digestion.

Malvern Panalytical specialists have developed a turn-key solution, including certified reference materials (CRMs) and calibration templates, for the analysis of both precursor and cathode material composition with the benchtop Epsilon 4 EDXRF or floor-standing Zetium WDXRF spectrometers.

This webinar will focus on the following key topics:

• On-line and at-line XRF analysis of solutions containing Ni, Co and Mn
• NCM-certified reference materials for XRF calibration purposes
• Turn-key solution for the XRF analysis of NCM precursors and cathodes

Presenter
Alexander Komelkov – XRF Application Specialist at Malvern Panalytical

Back in 1996 Alexander obtained a diploma of Engineer-Physicist followed by Master of Science degree in Physics in 2000. Then he worked in a metallurgical and a mining industries as a chemical analysist and R&D specialist.

In 2008 Alexander joined (Malvern) Panalytical as an Application Specialist for X-Ray Fluorescence analysis. Currently, Alexander provides XRF expertise consultancy to customers, develops advanced XRF applications and solutions, participates in XRF R&D projects. The main areas of expertise are geological and mining applications, as well as borate fusion for XRF analysis. He is co-creator of the methodology for combined WD/ED XRF analysis.

Malvern Panalytical is a proud sponsor of this event.

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